4 article(s) from Haviland, David B.
Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications
- August K. Roos,
- Ermes Scarano,
- Elisabet K. Arvidsson,
- Erik Holmgren and
- David B. Haviland
Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23
Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
- Stanislav S. Borysov,
- Daniel Forchheimer and
- David B. Haviland
Beilstein J. Nanotechnol. 2014, 5, 1899–1904, doi:10.3762/bjnano.5.200
![[Graphic 25]](/bjnano/content/inline/2190-4286-5-200-i35.png?max-width=637&scale=1.18182)
, using Equation 9 for two different cantilevers: ...
Polynomial force approximations and multifrequency atomic force microscopy
- Daniel Platz,
- Daniel Forchheimer,
- Erik A. Tholén and
- David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41
![[Graphic 19]](/bjnano/content/inline/2190-4286-4-41-i45.png?max-width=637&scale=1.18182)
matrix (a) and its pseudo-inverse (b). Only rows with non-zero elements are d...
Interpreting motion and force for narrow-band intermodulation atomic force microscopy
- Daniel Platz,
- Daniel Forchheimer,
- Erik A. Tholén and
- David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5
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